Nakamura, T. (2008). Terrestrial neutron-induced soft errors in advanced memory devices. Hackensack, NJ.: World Scientific.
Παραπομπή Chicago StyleNakamura, Takashi. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. Hackensack, NJ.: World Scientific, 2008.
Παραπομπή MLANakamura, Takashi. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. Hackensack, NJ.: World Scientific, 2008.
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