Takeda, E., Yang, C. Y., & Miura-Hamada, A. (1995). Hot-carrier effects in MOS devices. San Diego: Academic Press.
Παραπομπή Chicago StyleTakeda, Eiji, Cary Y. Yang, and Akemi Miura-Hamada. Hot-carrier Effects in MOS Devices. San Diego: Academic Press, 1995.
Παραπομπή MLATakeda, Eiji, Cary Y. Yang, and Akemi Miura-Hamada. Hot-carrier Effects in MOS Devices. San Diego: Academic Press, 1995.
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