Pichler, P. (2004). Intrinsic point defects, impurities, and their diffusion in silicon. Wien: Springer.
Παραπομπή Chicago StylePichler, P. Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon. Wien: Springer, 2004.
Παραπομπή MLAPichler, P. Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon. Wien: Springer, 2004.
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