Runyan, W. R., & Shaffner, T. J. (1998). Semiconductor measurements and instrumentation (2nd ed.). New York: McGraw-Hill.
Παραπομπή Chicago StyleRunyan, W. R., and T. J. Shaffner. Semiconductor Measurements and Instrumentation. 2nd ed. New York: McGraw-Hill, 1998.
Παραπομπή MLARunyan, W. R., and T. J. Shaffner. Semiconductor Measurements and Instrumentation. 2nd ed. New York: McGraw-Hill, 1998.
Πρόσοχή: Οι παραπομπές μπορεί να μην είναι 100% ακριβείς.